標準解讀
《T/SCGS 313010-2024 磁粒子成像設(shè)備激勵系統(tǒng)工作參數(shù)評價規(guī)范》是一份針對磁粒子成像技術(shù)中使用的激勵系統(tǒng)性能進行評估的標準文件。該標準詳細規(guī)定了用于評價磁粒子成像設(shè)備激勵系統(tǒng)工作參數(shù)的方法、指標及測試條件,旨在確保此類設(shè)備能夠達到預(yù)期的性能水平,從而支持醫(yī)學診斷或科學研究等領(lǐng)域應(yīng)用時的質(zhì)量與安全。
根據(jù)此標準,首先明確了術(shù)語定義,包括但不限于“磁粒子”、“成像區(qū)域”、“激勵線圈”等關(guān)鍵概念,為后續(xù)內(nèi)容的理解打下基礎(chǔ)。接著,標準列出了需要被測量的主要參數(shù),如磁場強度分布、頻率響應(yīng)特性、時間穩(wěn)定性等,并對每一項參數(shù)給出了具體的測試方法和要求。此外,還特別強調(diào)了環(huán)境因素(如溫度、濕度)可能對測試結(jié)果產(chǎn)生的影響及其控制措施。
對于測試過程,《T/SCGS 313010-2024》提出了詳細的指導(dǎo)原則,包括測試前準備、操作步驟、數(shù)據(jù)記錄方式等,以保證不同實驗室之間可以獲得可比性高的實驗結(jié)果。同時,也指定了如何處理異常值以及重復(fù)性檢驗的要求,增強了整個評價體系的可靠性和準確性。
最后,該標準還提供了關(guān)于報告編寫格式的建議,確保所有相關(guān)方都能清晰地理解測試結(jié)果及其意義。通過遵循這份標準,制造商和服務(wù)提供商可以更好地了解其產(chǎn)品在實際使用中的表現(xiàn),而研究人員則能基于更準確的數(shù)據(jù)開展深入研究。
如需獲取更多詳盡信息,請直接參考下方經(jīng)官方授權(quán)發(fā)布的權(quán)威標準文檔。
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- 2024-03-11 頒布
- 2024-03-11 實施
文檔簡介
ICS01.100.01
CCSJ04
團體標準
T/SCGS313010—2024
磁粒子成像設(shè)備激勵系統(tǒng)
工作參數(shù)評價規(guī)范
Specificationforevaluationofoperatingparametersof
excitationsystemsformagneticparticleimagingequipment
2024?03?11發(fā)布2024?03?11實施
中國圖學學會發(fā)布
中國標準出版社出版
T/SCGS313010—2024
目次
前言··························································································································Ⅲ
引言··························································································································Ⅳ
1范圍·······················································································································1
2規(guī)范性引用文件········································································································1
3術(shù)語和定義··············································································································1
4磁粒子成像設(shè)備激勵系統(tǒng)····························································································2
4.1磁粒子成像設(shè)備系統(tǒng)組成······················································································2
4.2磁粒子成像設(shè)備組成和各部件主要功能····································································2
4.3激勵系統(tǒng)組成及功能····························································································3
5磁粒子成像設(shè)備激勵系統(tǒng)工作參數(shù)評價指標····································································3
5.1概述·················································································································3
5.2激勵磁場均勻性指標····························································································3
5.3機械結(jié)構(gòu)穩(wěn)定性指標····························································································3
5.4系統(tǒng)電力穩(wěn)定性指標····························································································4
5.5系統(tǒng)散熱效率指標·······························································································4
6檢測方法·················································································································5
6.1通用要求···········································································································5
6.2激勵磁場均勻性檢測方法······················································································5
6.3機械結(jié)構(gòu)穩(wěn)定性檢測方法······················································································5
6.4系統(tǒng)電力穩(wěn)定性檢測方法······················································································5
6.5系統(tǒng)散熱效率檢測方法·························································································5
附錄A(規(guī)范性)激勵磁場均勻性檢測方法·······································································6
A.1檢測儀器··········································································································6
A.2準備測試條件·····································································································6
A.3設(shè)置掃描參數(shù)·····································································································6
A.4測試激勵磁場均勻性方法······················································································6
A.5結(jié)果表述···········································································································7
附錄B(規(guī)范性)機械結(jié)構(gòu)穩(wěn)定性檢測方法········································································8
B.1制作機械結(jié)構(gòu)穩(wěn)定性檢測模體················································································8
B.2準備測試條件·····································································································8
B.3設(shè)置掃描參數(shù)·····································································································8
B.4測試機械結(jié)構(gòu)穩(wěn)定性····························································································8
B.5結(jié)果表述···········································································································9
Ⅰ
T/SCGS313010—2024
附錄C(規(guī)范性)系統(tǒng)電力穩(wěn)定性檢測方法······································································10
C.1檢測儀器·········································································································10
C.2準備測試條件···································································································10
C.3設(shè)置掃描參數(shù)···································································································10
C.4測試系統(tǒng)電力穩(wěn)定性··························································································10
C.5結(jié)果表述·········································································································10
附錄D(規(guī)范性)系統(tǒng)散熱效率檢測方法·········································································12
D.1檢測儀器·········································································································12
D.2準備測試條件···································································································12
D.3設(shè)置掃描參數(shù)···································································································12
D.4檢測激勵線圈散熱情況·······················································································12
D.5結(jié)果表述·········································································································13
參考文獻····················································································································14
Ⅱ
T/SCGS313010—2024
前言
本文件按照GB/T1.1—2020《標準化工作導(dǎo)則第1部分:標準化文件的結(jié)構(gòu)和起草規(guī)則》的規(guī)
定起草。
請注意本文件的某些內(nèi)容可能涉及專利。本文件的發(fā)布機構(gòu)不承擔識別專利的責任。
本文件由北京航空航天大學提出。
本文件由中國圖學學會歸口。
本文件起草單位:北京航空航天大學、中國科學院自動化研究所、中國科學院昆明動物研究所。
本文件主要起草人:安羽、李光輝、杜洋、田捷、惠輝、劉晏君、雷思奧、何杰、張博、馮欣、鐘景、牟瑋、
劉振宇、尹琳、禹曉梅、王建紅、李鴻麗。
Ⅲ
T/SCGS313010—2024
引言
磁粒子成像是新一代生物醫(yī)學成像技術(shù),基于磁粒子作為示蹤劑,利用其非線性磁化響應(yīng)信號,具
有高靈敏度、高特異性、高時空分辨率、無輻射且無成像深度限制等優(yōu)勢,在國內(nèi)外均得到了快速的發(fā)
展和應(yīng)用,且已展現(xiàn)出一定的技術(shù)積累和應(yīng)用潛力。目前,該技術(shù)已經(jīng)在檢測深層微小腫瘤、植介入血
管成像、在體細胞示蹤、實時動態(tài)血流監(jiān)測、腦卒中和腦損傷檢測、肺灌注成像等多領(lǐng)域開展預(yù)臨床研
究,被證明在臨床上具有廣泛的應(yīng)用前景。
磁粒子成像設(shè)備激勵系統(tǒng)的工作參數(shù)直接決定設(shè)備工作性能,影響成像質(zhì)量,最終關(guān)乎到診斷檢
查結(jié)果的準確性。磁粒子成像設(shè)備工作激勵系統(tǒng)工作參數(shù)是設(shè)備性能的核心要素,這些參數(shù)的設(shè)定直
接關(guān)系到成像質(zhì)量,進一步影響診斷結(jié)果的準確性。然而磁粒子成像設(shè)備激勵系統(tǒng)的評價和規(guī)范方
面,目前尚無統(tǒng)一的標準和定量的指標。因此對磁粒子成像設(shè)備激勵系統(tǒng)工作參數(shù)進行評定和相關(guān)指
標的定量分析,形成統(tǒng)一標準,具有重要意義。
本文件制定通用要求,以規(guī)范磁粒子成像設(shè)備激勵系統(tǒng)的研發(fā)與質(zhì)量評估,推動磁粒子成像技術(shù)
的高質(zhì)量發(fā)展。
本文件的發(fā)布機構(gòu)提請注意,聲明符合本文件時,可能涉及到專利(CN114533016B)“基于梯形波
激勵的多色定量磁納米粒子成像方法及系統(tǒng)”,(CN114521883B)“閉孔式無場線掃描磁粒子成像裝置、
系統(tǒng)及方法”,(CN115778353B)“基于旋轉(zhuǎn)諧波圖的磁場自由線磁粒子成像方法”,(CN115153490B)
“基于非旋轉(zhuǎn)場自由線的磁納米粒子檢測成像裝置、方法”,(CN117686954B)“基于振蕩梯度磁場編碼
的磁粒子成像方法及設(shè)備”,(US11,454,681B1)“Magneticparticleimagingmethodbasedonnon?ideal
fieldfreepoint”以及相關(guān)的專利的使用。
本文件的發(fā)布機構(gòu)對于這些專利的真實性、有效性和范圍無任何立場。
該專利持有人已向本文件的發(fā)布機構(gòu)承諾,他們愿意同任何申請人在合理且無歧視的條款和條件
下,就專利授權(quán)許可進行談判。該專利持有人的聲明在本文件的發(fā)布機構(gòu)備案。相關(guān)信息可以通過以
下聯(lián)系方式獲得:
專利持有人姓名:田捷、安羽、惠輝、唐振超、李光輝、劉晏君、雷思奧、何杰、張博、張浩然、鐘景;
地址:北京市海淀區(qū)花園路街道37號北京航空航天大學學院路校區(qū)。
請注意除上述專利外,本文件的某些內(nèi)容仍可能涉及專利。本文件的發(fā)布機構(gòu)不承擔識別專利的
責任。
Ⅳ
T/SCGS313010—2024
磁粒子成像設(shè)備激勵系統(tǒng)
工作參數(shù)評價規(guī)范
1范圍
本文件規(guī)定了磁粒子成像設(shè)備激勵系統(tǒng)工作參數(shù)評價指標與檢測方法。
本文件適用于永磁體、常導(dǎo)磁體和超導(dǎo)磁體磁粒子成像設(shè)備的驗收檢驗和狀態(tài)檢驗。
2規(guī)范性引用文件
下列文件中的內(nèi)容通過文中的規(guī)范性引用而構(gòu)成本文件必不可少的條款。其中,注日期的引用文
件,僅該日期對應(yīng)的版本適用于本文件;不注日期的引用文件,其最新版本(包括所有的修改單
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