標(biāo)準(zhǔn)解讀
《T/SCGS 313010-2024 磁粒子成像設(shè)備激勵(lì)系統(tǒng)工作參數(shù)評(píng)價(jià)規(guī)范》是一份針對(duì)磁粒子成像技術(shù)中使用的激勵(lì)系統(tǒng)性能進(jìn)行評(píng)估的標(biāo)準(zhǔn)文件。該標(biāo)準(zhǔn)詳細(xì)規(guī)定了用于評(píng)價(jià)磁粒子成像設(shè)備激勵(lì)系統(tǒng)工作參數(shù)的方法、指標(biāo)及測(cè)試條件,旨在確保此類設(shè)備能夠達(dá)到預(yù)期的性能水平,從而支持醫(yī)學(xué)診斷或科學(xué)研究等領(lǐng)域應(yīng)用時(shí)的質(zhì)量與安全。
根據(jù)此標(biāo)準(zhǔn),首先明確了術(shù)語(yǔ)定義,包括但不限于“磁粒子”、“成像區(qū)域”、“激勵(lì)線圈”等關(guān)鍵概念,為后續(xù)內(nèi)容的理解打下基礎(chǔ)。接著,標(biāo)準(zhǔn)列出了需要被測(cè)量的主要參數(shù),如磁場(chǎng)強(qiáng)度分布、頻率響應(yīng)特性、時(shí)間穩(wěn)定性等,并對(duì)每一項(xiàng)參數(shù)給出了具體的測(cè)試方法和要求。此外,還特別強(qiáng)調(diào)了環(huán)境因素(如溫度、濕度)可能對(duì)測(cè)試結(jié)果產(chǎn)生的影響及其控制措施。
對(duì)于測(cè)試過(guò)程,《T/SCGS 313010-2024》提出了詳細(xì)的指導(dǎo)原則,包括測(cè)試前準(zhǔn)備、操作步驟、數(shù)據(jù)記錄方式等,以保證不同實(shí)驗(yàn)室之間可以獲得可比性高的實(shí)驗(yàn)結(jié)果。同時(shí),也指定了如何處理異常值以及重復(fù)性檢驗(yàn)的要求,增強(qiáng)了整個(gè)評(píng)價(jià)體系的可靠性和準(zhǔn)確性。
最后,該標(biāo)準(zhǔn)還提供了關(guān)于報(bào)告編寫格式的建議,確保所有相關(guān)方都能清晰地理解測(cè)試結(jié)果及其意義。通過(guò)遵循這份標(biāo)準(zhǔn),制造商和服務(wù)提供商可以更好地了解其產(chǎn)品在實(shí)際使用中的表現(xiàn),而研究人員則能基于更準(zhǔn)確的數(shù)據(jù)開(kāi)展深入研究。
如需獲取更多詳盡信息,請(qǐng)直接參考下方經(jīng)官方授權(quán)發(fā)布的權(quán)威標(biāo)準(zhǔn)文檔。
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- 2024-03-11 頒布
- 2024-03-11 實(shí)施
文檔簡(jiǎn)介
ICS01.100.01
CCSJ04
團(tuán)體標(biāo)準(zhǔn)
T/SCGS313010—2024
磁粒子成像設(shè)備激勵(lì)系統(tǒng)
工作參數(shù)評(píng)價(jià)規(guī)范
Specificationforevaluationofoperatingparametersof
excitationsystemsformagneticparticleimagingequipment
2024?03?11發(fā)布2024?03?11實(shí)施
中國(guó)圖學(xué)學(xué)會(huì)發(fā)布
中國(guó)標(biāo)準(zhǔn)出版社出版
T/SCGS313010—2024
目次
前言··························································································································Ⅲ
引言··························································································································Ⅳ
1范圍·······················································································································1
2規(guī)范性引用文件········································································································1
3術(shù)語(yǔ)和定義··············································································································1
4磁粒子成像設(shè)備激勵(lì)系統(tǒng)····························································································2
4.1磁粒子成像設(shè)備系統(tǒng)組成······················································································2
4.2磁粒子成像設(shè)備組成和各部件主要功能····································································2
4.3激勵(lì)系統(tǒng)組成及功能····························································································3
5磁粒子成像設(shè)備激勵(lì)系統(tǒng)工作參數(shù)評(píng)價(jià)指標(biāo)····································································3
5.1概述·················································································································3
5.2激勵(lì)磁場(chǎng)均勻性指標(biāo)····························································································3
5.3機(jī)械結(jié)構(gòu)穩(wěn)定性指標(biāo)····························································································3
5.4系統(tǒng)電力穩(wěn)定性指標(biāo)····························································································4
5.5系統(tǒng)散熱效率指標(biāo)·······························································································4
6檢測(cè)方法·················································································································5
6.1通用要求···········································································································5
6.2激勵(lì)磁場(chǎng)均勻性檢測(cè)方法······················································································5
6.3機(jī)械結(jié)構(gòu)穩(wěn)定性檢測(cè)方法······················································································5
6.4系統(tǒng)電力穩(wěn)定性檢測(cè)方法······················································································5
6.5系統(tǒng)散熱效率檢測(cè)方法·························································································5
附錄A(規(guī)范性)激勵(lì)磁場(chǎng)均勻性檢測(cè)方法·······································································6
A.1檢測(cè)儀器··········································································································6
A.2準(zhǔn)備測(cè)試條件·····································································································6
A.3設(shè)置掃描參數(shù)·····································································································6
A.4測(cè)試激勵(lì)磁場(chǎng)均勻性方法······················································································6
A.5結(jié)果表述···········································································································7
附錄B(規(guī)范性)機(jī)械結(jié)構(gòu)穩(wěn)定性檢測(cè)方法········································································8
B.1制作機(jī)械結(jié)構(gòu)穩(wěn)定性檢測(cè)模體················································································8
B.2準(zhǔn)備測(cè)試條件·····································································································8
B.3設(shè)置掃描參數(shù)·····································································································8
B.4測(cè)試機(jī)械結(jié)構(gòu)穩(wěn)定性····························································································8
B.5結(jié)果表述···········································································································9
Ⅰ
T/SCGS313010—2024
附錄C(規(guī)范性)系統(tǒng)電力穩(wěn)定性檢測(cè)方法······································································10
C.1檢測(cè)儀器·········································································································10
C.2準(zhǔn)備測(cè)試條件···································································································10
C.3設(shè)置掃描參數(shù)···································································································10
C.4測(cè)試系統(tǒng)電力穩(wěn)定性··························································································10
C.5結(jié)果表述·········································································································10
附錄D(規(guī)范性)系統(tǒng)散熱效率檢測(cè)方法·········································································12
D.1檢測(cè)儀器·········································································································12
D.2準(zhǔn)備測(cè)試條件···································································································12
D.3設(shè)置掃描參數(shù)···································································································12
D.4檢測(cè)激勵(lì)線圈散熱情況·······················································································12
D.5結(jié)果表述·········································································································13
參考文獻(xiàn)····················································································································14
Ⅱ
T/SCGS313010—2024
前言
本文件按照GB/T1.1—2020《標(biāo)準(zhǔn)化工作導(dǎo)則第1部分:標(biāo)準(zhǔn)化文件的結(jié)構(gòu)和起草規(guī)則》的規(guī)
定起草。
請(qǐng)注意本文件的某些內(nèi)容可能涉及專利。本文件的發(fā)布機(jī)構(gòu)不承擔(dān)識(shí)別專利的責(zé)任。
本文件由北京航空航天大學(xué)提出。
本文件由中國(guó)圖學(xué)學(xué)會(huì)歸口。
本文件起草單位:北京航空航天大學(xué)、中國(guó)科學(xué)院自動(dòng)化研究所、中國(guó)科學(xué)院昆明動(dòng)物研究所。
本文件主要起草人:安羽、李光輝、杜洋、田捷、惠輝、劉晏君、雷思奧、何杰、張博、馮欣、鐘景、牟瑋、
劉振宇、尹琳、禹曉梅、王建紅、李鴻麗。
Ⅲ
T/SCGS313010—2024
引言
磁粒子成像是新一代生物醫(yī)學(xué)成像技術(shù),基于磁粒子作為示蹤劑,利用其非線性磁化響應(yīng)信號(hào),具
有高靈敏度、高特異性、高時(shí)空分辨率、無(wú)輻射且無(wú)成像深度限制等優(yōu)勢(shì),在國(guó)內(nèi)外均得到了快速的發(fā)
展和應(yīng)用,且已展現(xiàn)出一定的技術(shù)積累和應(yīng)用潛力。目前,該技術(shù)已經(jīng)在檢測(cè)深層微小腫瘤、植介入血
管成像、在體細(xì)胞示蹤、實(shí)時(shí)動(dòng)態(tài)血流監(jiān)測(cè)、腦卒中和腦損傷檢測(cè)、肺灌注成像等多領(lǐng)域開(kāi)展預(yù)臨床研
究,被證明在臨床上具有廣泛的應(yīng)用前景。
磁粒子成像設(shè)備激勵(lì)系統(tǒng)的工作參數(shù)直接決定設(shè)備工作性能,影響成像質(zhì)量,最終關(guān)乎到診斷檢
查結(jié)果的準(zhǔn)確性。磁粒子成像設(shè)備工作激勵(lì)系統(tǒng)工作參數(shù)是設(shè)備性能的核心要素,這些參數(shù)的設(shè)定直
接關(guān)系到成像質(zhì)量,進(jìn)一步影響診斷結(jié)果的準(zhǔn)確性。然而磁粒子成像設(shè)備激勵(lì)系統(tǒng)的評(píng)價(jià)和規(guī)范方
面,目前尚無(wú)統(tǒng)一的標(biāo)準(zhǔn)和定量的指標(biāo)。因此對(duì)磁粒子成像設(shè)備激勵(lì)系統(tǒng)工作參數(shù)進(jìn)行評(píng)定和相關(guān)指
標(biāo)的定量分析,形成統(tǒng)一標(biāo)準(zhǔn),具有重要意義。
本文件制定通用要求,以規(guī)范磁粒子成像設(shè)備激勵(lì)系統(tǒng)的研發(fā)與質(zhì)量評(píng)估,推動(dòng)磁粒子成像技術(shù)
的高質(zhì)量發(fā)展。
本文件的發(fā)布機(jī)構(gòu)提請(qǐng)注意,聲明符合本文件時(shí),可能涉及到專利(CN114533016B)“基于梯形波
激勵(lì)的多色定量磁納米粒子成像方法及系統(tǒng)”,(CN114521883B)“閉孔式無(wú)場(chǎng)線掃描磁粒子成像裝置、
系統(tǒng)及方法”,(CN115778353B)“基于旋轉(zhuǎn)諧波圖的磁場(chǎng)自由線磁粒子成像方法”,(CN115153490B)
“基于非旋轉(zhuǎn)場(chǎng)自由線的磁納米粒子檢測(cè)成像裝置、方法”,(CN117686954B)“基于振蕩梯度磁場(chǎng)編碼
的磁粒子成像方法及設(shè)備”,(US11,454,681B1)“Magneticparticleimagingmethodbasedonnon?ideal
fieldfreepoint”以及相關(guān)的專利的使用。
本文件的發(fā)布機(jī)構(gòu)對(duì)于這些專利的真實(shí)性、有效性和范圍無(wú)任何立場(chǎng)。
該專利持有人已向本文件的發(fā)布機(jī)構(gòu)承諾,他們?cè)敢馔魏紊暾?qǐng)人在合理且無(wú)歧視的條款和條件
下,就專利授權(quán)許可進(jìn)行談判。該專利持有人的聲明在本文件的發(fā)布機(jī)構(gòu)備案。相關(guān)信息可以通過(guò)以
下聯(lián)系方式獲得:
專利持有人姓名:田捷、安羽、惠輝、唐振超、李光輝、劉晏君、雷思奧、何杰、張博、張浩然、鐘景;
地址:北京市海淀區(qū)花園路街道37號(hào)北京航空航天大學(xué)學(xué)院路校區(qū)。
請(qǐng)注意除上述專利外,本文件的某些內(nèi)容仍可能涉及專利。本文件的發(fā)布機(jī)構(gòu)不承擔(dān)識(shí)別專利的
責(zé)任。
Ⅳ
T/SCGS313010—2024
磁粒子成像設(shè)備激勵(lì)系統(tǒng)
工作參數(shù)評(píng)價(jià)規(guī)范
1范圍
本文件規(guī)定了磁粒子成像設(shè)備激勵(lì)系統(tǒng)工作參數(shù)評(píng)價(jià)指標(biāo)與檢測(cè)方法。
本文件適用于永磁體、常導(dǎo)磁體和超導(dǎo)磁體磁粒子成像設(shè)備的驗(yàn)收檢驗(yàn)和狀態(tài)檢驗(yàn)。
2規(guī)范性引用文件
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