@Warning!MakesurethatyouobtainedthisWarning!MakesurethatyouobtainedthispublicationfromanauthAttention!VeuillezvousassurerquevouRegisteredtrademarkoftheInteMarquedeposeedelaCommis 7 20 21 21 26 29 29 40 41 42 45 46 49 AnnexB(normative)MeasureAnnexB(normative)Measure AnnexC(informative)RecommendationsofCISPRforprotectionofcertain 66 C.3Recommendationsforp 76AnnexD(informative)Measurements 79 81 AnnexE(informative)Guidanceonpreventionofsaturationeffectsinmitig E.2Recommendationsforavoidanceofsaturationeffect E.3.2Insertofseriesinduc E.3.3EmploymentofadditionalcommonmodedecouplingcinterfacebetweentheAEportoftheDC-ANandthelaboratory AnnexF(normative)Add 90 Figure3-Exampleforatypicalcablearrangementforme Figure4-Exampleforatypicaltestsetupformeasuremento 45Figure5-EUTboundarydeterminationforradiateddisturbancemeasurementsof 49Figure6-Exampleofatypicaltestsetupforconducteddisturbancemeasurementonafloor-standingrobotsyst Figure7-Exampleofatypicaltestsetupforradiateddisturbancfloor-standingrobotsystem Figure8-Exampleofatypicaltest Figure9-Exampleofatypicaltestsetupforradiateddisturbanceme 53Figure10-Dispositionofm group2equipmentoperatingatfrequenciesabove400MHz group2equipmentoperatingatfrequenciesabove400MHz 88FigureE.6-Changeintheresona FigureE.7-DC-ANcircu 26 Figure12-Typicalarrangementform powerportswithaDC-ANusedasvoltage ff FigureE.3-BlockingofflowofcommonmodeRFcurrentbyemploymentofaddi FigureE.5-PreventionofsaturationofFigureE.5-Preventionofsaturationofmitigationfiltersbyuseofadditional 23 24 25 Table12-DisturbancTable12-Disturbanc Table17-Electromagneticoperatingatfrequenciesabove400MHz 27Table10-Requiredhighestfrequencyforrad 28 28Table18-Electromagneticradiationdis Table21-Electromagneticradiationdist Table23-Operationmodesf 57 TableC.1-Limitsforelectromagneticradtoprotectspecificsafety-relatedradioservi PubliclyAvailableSpecifications(PPubliclyAvailableSpecifications(PconsensusofopinioconsensusofopinioEQ\*jc3\*hps19\o\al(\s\up3(Com),Publ)EQ\*jc3\*hps19\o\al(\s\up3(mittee),cation)EQ\*jc3\*hps19\o\al(\s\up3(s),s)EQ\*jc3\*hps19\o\al(\s\up3(n),is)EQ\*jc3\*hps19\o\al(\s\up3(hatsens),accurate)EQ\*jc3\*hps19\o\al(\s\up3(e),,I)EQ\*jc3\*hps19\o\al(\s\up3(Wh),EC)EQ\*jc3\*hps19\o\al(\s\up3(leallre),cannot)EQ\*jc3\*hps19\o\al(\s\up3(s),e)EQ\*jc3\*hps19\o\al(\s\up3(nabl),held)EQ\*jc3\*hps19\o\al(\s\up3(eff),es)EQ\*jc3\*hps19\o\al(\s\up3(o),p)EQ\*jc3\*hps19\o\al(\s\up3(rt),o)EQ\*jc3\*hps19\o\al(\s\up3(s),n)EQ\*jc3\*hps19\o\al(\s\up3(arem),iblef)EQ\*jc3\*hps19\o\al(\s\up3(a),o)EQ\*jc3\*hps19\o\al(\s\up3(e),th)EQ\*jc3\*hps19\o\al(\s\up3(toens),eway)EQ\*jc3\*hps19\o\al(\s\up3(re),n)EQ\*jc3\*hps19\o\al(\s\up3(a),hi)EQ\*jc3\*hps19\o\al(\s\up3(t),c)EQ\*jc3\*hps19\o\al(\s\up3(th),h)EQ\*jc3\*hps19\o\al(\s\up3(e),th)EQ\*jc3\*hps19\o\al(\s\up3(te),e)EQ\*jc3\*hps19\o\al(\s\up3(c),y)EQ\*jc3\*hps19\o\al(\s\up3(hnical),areu)EQ\*jc3\*hps19\o\al(\s\up3(con),sed)EQ\*jc3\*hps19\o\al(\s\up3(e),o)EQ\*jc3\*hps19\o\al(\s\up3(n),r)EQ\*jc3\*hps19\o\al(\s\up3(t),f)EQ\*jc3\*hps19\o\al(\s\up3(of),or)EQ\*jc3\*hps19\o\al(\s\up3(IE),an)EQ\*jc3\*hps19\o\al(\s\up3(C),y)EQ\*jc3\*hps19\o\al(\s\up4(n),t)EQ\*jc3\*hps19\o\al(\s\up4(o),a)EQ\*jc3\*hps19\o\al(\s\up4(erto),pare)EQ\*jc3\*hps19\o\al(\s\up4(promoteinternat),tlytothemaximu)EQ\*jc3\*hps19\o\al(\s\up4(nalun),extent)EQ\*jc3\*hps19\o\al(\s\up4(form),poss)EQ\*jc3\*hps19\o\al(\s\up4(ty,),ble)EQ\*jc3\*hps19\o\al(\s\up4(E),in)EQ\*jc3\*hps19\o\al(\s\up4(C),th)EQ\*jc3\*hps19\o\al(\s\up4(Na),eir)EQ\*jc3\*hps19\o\al(\s\up4(i),n)EQ\*jc3\*hps19\o\al(\s\up4(o),a)EQ\*jc3\*hps19\o\al(\s\up4(nalC),tional)EQ\*jc3\*hps19\o\al(\s\up4(o),a)EQ\*jc3\*hps19\o\al(\s\up4(m),n)EQ\*jc3\*hps19\o\al(\s\up4(i),r)EQ\*jc3\*hps19\o\al(\s\up4(tt),e)EQ\*jc3\*hps19\o\al(\s\up4(eesu),gional)EQ\*jc3\*hps19\o\al(\s\up4(n),p)EQ\*jc3\*hps19\o\al(\s\up4(ertak),blicat)EQ\*jc3\*hps19\o\al(\s\up4(e),io)EQ\*jc3\*hps19\o\al(\s\up4(to),ns)EQ\*jc3\*hps19\o\al(\s\up4(app),Any)EQ\*jc3\*hps19\o\al(\s\up4(y),d)EQ\*jc3\*hps19\o\al(\s\up4(IEC),verg)EQ\*jc3\*hps19\o\al(\s\up4(Pu),nc)EQ\*jc3\*hps19\o\al(\s\up4(ica),bet)EQ\*jc3\*hps19\o\al(\s\up4(n),e)EQ\*jc3\*hps19\o\al(\s\up4(s),n)relatingtoindustrial,scientificandindustrialequipment,tooverheadpowerAmendment1:2016andThiseditionincludesthefollowingb)introductionoflimitsrequirementsgiveninthc)introductionofrequirementsforequipmentwd)introductionofdefine)considerationofsomeparticularconditionswhThisdocumentwasdraGuide107,Electromagneticcompatibilitypublications(2ofindustrial,scientificandmedical(ISM)radiThisCISPRpublicationEQ\*jc3\*hps22\o\al(\s\up2(decou),restric)EQ\*jc3\*hps22\o\al(\s\up2(pl),te)EQ\*jc3\*hps22\o\al(\s\up2(e),d)EQ\*jc3\*hps22\o\al(\s\up2(d),to)EQ\*jc3\*hps22\o\al(\s\up2(ro),th)EQ\*jc3\*hps22\o\al(\s\up2(m),e)EQ\*jc3\*hps22\o\al(\s\up2(t),lo)EQ\*jc3\*hps22\o\al(\s\up2(h),c)EQ\*jc3\*hps22\o\al(\s\up2(e),at)EQ\*jc3\*hps22\o\al(\s\up2(I),o)EQ\*jc3\*hps22\o\al(\s\up2(S),n)EQ\*jc3\*hps22\o\al(\s\up2(M),of)EQ\*jc3\*hps22\o\al(\s\up2(R),h)EQ\*jc3\*hps22\o\al(\s\up2(F),a)EQ\*jc3\*hps22\o\al(\s\up2(a),n)EQ\*jc3\*hps22\o\al(\s\up2(p),d)EQ\*jc3\*hps22\o\al(\s\up2(pl),iv)EQ\*jc3\*hps22\o\al(\s\up2(i),i)EQ\*jc3\*hps22\o\al(\s\up2(c),d)EQ\*jc3\*hps22\o\al(\s\up2(a),u)EQ\*jc3\*hps22\o\al(\s\up2(tio),al)EQ\*jc3\*hps22\o\al(\s\up2(n),ap)EQ\*jc3\*hps22\o\al(\s\up2(b),p)EQ\*jc3\*hps22\o\al(\s\up2(y),li)EQ\*jc3\*hps22\o\al(\s\up2(r),a)EQ\*jc3\*hps22\o\al(\s\up2(a),t)EQ\*jc3\*hps22\o\al(\s\up2(a),n)INDUSTRIAL,SCIENTIFRADIO-FREQUENCYDISTURBANCECHARACTERIThisdocumentappliestoThisdocumentcoISMequipmentwhichfunctionality)isincludedinthescfromaradiotransNOTE1ThisexclusiononlyappliestoRobotsusedforinduexcludedfromthescopeofthisdocuCISPR16-1-1:2019,Specificationforradimethods-Part1-1:Radiodisturbancemethods-Part1-2:Radiodforconducteddisturbanmethods-Part1-4:Radiodisturbanceandimmunitymeasuringapparatus-Antesitesforradiateddistumethods-Part2-1:Methodsofmeasurementofdisturbancesandimmunity-Conducteddisturbancemeasuremenmethods-Part2-3:Methodsofmeasurementofdisturbancesandimmunity-Radiateddisturbancemeasuremenmethods-Part4-2:Uncertainties,statisticsandlimitmodelling-MeasuringinstrumentationCISPR32:2015,Electromagneticcompatibilityofmultimediaequipment-EmissionElectromagneticcompatibilityIEC60601-2-2:2017,Medicalelectricalequipment-Part2-2:ParticularrequirementsforbasicsafetyandessentialperformanceofhighfrequencysurgicalequipmentandhighfrequencysurgicalaccesIEC61000-4-6:2023,Electromagneticcompatibility(EMC)-.Part4-measurementtechniques-Immunitytoconducteddisturbances,inducedbyradio-frequencyIEC61307:20112,Industrialmicrowaveheatdeterminationofpoweroutput/en/myitu/Publications/2020/09/02/14/23/RaEQ\*jc3\*hps21\o\al(\s\up8(ar),eq)EQ\*jc3\*hps21\o\al(\s\up8(c),u)EQ\*jc3\*hps21\o\al(\s\up8(we),pm)EQ\*jc3\*hps21\o\al(\s\up8(ldi),en)EQ\*jc3\*hps21\o\al(\s\up8(n),t)EQ\*jc3\*hps21\o\al(\s\up8(e),r)EQ\*jc3\*hps21\o\al(\s\up8(qu),ap)EQ\*jc3\*hps21\o\al(\s\up8(me),ying)EQ\*jc3\*hps21\o\al(\s\up8(t),current)[SOURCE:CISPR16-1-2:2014/AMD1:2017,3.1.6alsoprovidingthenecessarydecouplingfromcEQ\*jc3\*hps21\o\al(\s\up0(Note),batte)EQ\*jc3\*hps21\o\al(\s\up0(1),y)electro-dischargemachiningEQ\*jc3\*hps21\o\al(\s\up8(E),a)EQ\*jc3\*hps21\o\al(\s\up8(DM),lthe)EQ\*jc3\*hps21\o\al(\s\up8(quipment),necessary)EQ\*jc3\*hps21\o\al(\s\up7(e),a)EQ\*jc3\*hps21\o\al(\s\up7(i),e)EQ\*jc3\*hps21\o\al(\s\up7(p),q)EQ\*jc3\*hps21\o\al(\s\up7(me),uip)EQ\*jc3\*hps21\o\al(\s\up7(nt),m)EQ\*jc3\*hps21\o\al(\s\up7(fo),nt)EQ\*jc3\*hps21\o\al(\s\up7(resistan),associate)EQ\*jc3\*hps21\o\al(\s\up7(wel),with)EQ\*jc3\*hps21\o\al(\s\up7(ng),car)EQ\*jc3\*hps21\o\al(\s\up7(a),y)EQ\*jc3\*hps21\o\al(\s\up7(ndallie),ngout)EQ\*jc3\*hps21\o\al(\s\up7(d),th)EQ\*jc3\*hps21\o\al(\s\up7(p),e)EQ\*jc3\*hps21\o\al(\s\up7(c),pr)EQ\*jc3\*hps21\o\al(\s\up7(e),o)EQ\*jc3\*hps21\o\al(\s\up7(s),c)EQ\*jc3\*hps21\o\al(\s\up7(ses),ess)shieldedenclosure,theinternalsurfacesofwhicharelinabsorbingmaterial(i.EQ\*jc3\*hps20\o\al(\s\up4(t),u)EQ\*jc3\*hps20\o\al(\s\up4(h),sEQ\*jc3\*hps20\o\al(\s\up4(t),u)EQ\*jc3\*hps20\o\al(\s\up4(h),s)EQ\*jc3\*hps20\o\al(\s\up3(e),e)EQ\*jc3\*hps20\o\al(\s\up3(e),d)EQ\*jc3\*hps20\o\al(\s\up3(u),n)EQ\*jc3\*hps20\o\al(\s\up3(m),e)EQ\*jc3\*hps20\o\al(\s\up3(e),e)EQ\*jc3\*hps20\o\al(\s\up4(nt),q)EQ\*jc3\*hps20\o\al(\s\up2(g.),m)EQ\*jc3\*hps20\o\al(\s\up4(X),e)EQ\*jc3\*hps20\o\al(\s\up3(-ra),nt)EQ\*jc3\*hps20\o\al(\s\up2(agn),sw)EQ\*jc3\*hps20\o\al(\s\up3(o),it)EQ\*jc3\*hps20\o\al(\s\up3(s),c)EQ\*jc3\*hps20\o\al(\s\up4(tice),hing)EQ\*jc3\*hps20\o\al(\s\up2(qu),m)EQ\*jc3\*hps20\o\al(\s\up3(m),e)EQ\*jc3\*hps20\o\al(\s\up4(ent),po)EQ\*jc3\*hps20\o\al(\s\up3(o),e)EQ\*jc3\*hps20\o\al(\s\up2(g),s)EQ\*jc3\*hps20\o\al(\s\up3(e),u)EQ\*jc3\*hps20\o\al(\s\up3(n),p)EQ\*jc3\*hps20\o\al(\s\up3(er),pl)EQ\*jc3\*hps20\o\al(\s\up3(a),y)EQ\*jc3\*hps20\o\al(\s\up3(e),R)EQ\*jc3\*hps20\o\al(\s\up4(d),F)EQ\*jc3\*hps20\o\al(\s\up4(out),ste)EQ\*jc3\*hps20\o\al(\s\up3(s),r)EQ\*jc3\*hps20\o\al(\s\up4(i),i)EQ\*jc3\*hps20\o\al(\s\up4(d),li)EQ\*jc3\*hps20\o\al(\s\up3(e),z)EQ\*jc3\*hps20\o\al(\s\up3(a),r)EQ\*jc3\*hps20\o\al(\s\up3(u),cr)EQ\*jc3\*hps20\o\al(\s\up3(s),o)EQ\*jc3\*hps20\o\al(\s\up4(in),v)EQ\*jc3\*hps20\o\al(\s\up4(h),o)EQ\*jc3\*hps20\o\al(\s\up3(e),v)frequencyonwhichtheISMequhighestfundamentalfrequencygenerateenergyforindustrial,scientific,medical,domesticindustrial,scientific,medical,domesticorsimilarpurposes,excludingapoftelecommunicationsandinformationtechnologyandothautomaticallycontrolled,reprogrammablemultipurposemanipulaasetofvoltagelevels[SOURCE:IEC60050-601:1985,601-01-26,modifiedfacilityusedformeasurementsofelectromagneticfemissiontestingofprodEQ\*jc3\*hps23\o\al(\s\up7(p),e)EQ\*jc3\*hps23\o\al(\s\up7(hotovo),ectricp)EQ\*jc3\*hps23\o\al(\s\up7(ltaic),ower)EQ\*jc3\*hps23\o\al(\s\up7(p),g)EQ\*jc3\*hps23\o\al(\s\up7(ower),enera)EQ\*jc3\*hps23\o\al(\s\up7(eratings),systemw)EQ\*jc3\*hps23\o\al(\s\up7(s),ic)EQ\*jc3\*hps23\o\al(\s\up7(te),h)EQ\*jc3\*hps23\o\al(\s\up7(m),uses)EQ\*jc3\*hps20\o\al(\s\up8(powe),electr)EQ\*jc3\*hps20\o\al(\s\up8(r),c)EQ\*jc3\*hps20\o\al(\s\up8(c),l)EQ\*jc3\*hps20\o\al(\s\up8(nvers),evice)EQ\*jc3\*hps20\o\al(\s\up8(on),co)EQ\*jc3\*hps20\o\al(\s\up8(e),e)EQ\*jc3\*hps20\o\al(\s\up8(qui),rtin)EQ\*jc3\*hps20\o\al(\s\up8(p),g)EQ\*jc3\*hps20\o\al(\s\up8(m),o)EQ\*jc3\*hps20\o\al(\s\up8(e),n)EQ\*jc3\*hps20\o\al(\s\up8(n),e)respecttovoltage,curreassemblyconsistingofoneormoreradiastand-alonebasiswithorwithoutadditionalaofradiocommunicationorradiodete[SOURCE:IEC60050-713:1998[5],713-08-01-modified-"apparatus"replacedwith"device",deletionof"normally",additfrequencyrangeofequipmentundertest,eitherpositionedonatabletoporstan[SOURCE:CISPR16-2-3:2016andCISPRelectrodeandtheworkpiecefAGVAutomatedguidedveAPDAmplitudeprobabiCDNCVCFConstantvEMCElectromagnGCPCGridVCPVerticalcouplingplaxDSLAlldigitalsubscriasfundamentalintheformofelectromagneticradiation,inductiveand/orcapaciofmaterial,forinspection/analysispurposes,orfortransferofelectromagneNOTESeeAnnexAforexaClassAequipmentistheequipstrikingorstabilizingdevicesforarcweldingInbothcasesthemanufactudocument,thesedetailsconcerninformaForclassAequipment,theFormeasurementsatstandardizedtestWherethisdocumentgivesoptionsfortestingparti1)powerconversione2)gridconnectedpowerconvertorsTable2-DisturbancevoltagelimipowerdistributionnenotbyLVoverheadpowe55powergeneratingsystembyaprofessional.InthemanualaccompanyinprovidedonmitigationmeasuresphysicallyseparatedfromresidentialenvironmentNomeasurementsarerequirNomeasurementarerequirThefrequencyrangeforThefrequencyrangeforparticularapplicationwiththepurposeofavoidingradia-symmetricalDCportl-groundedmetalliccabtotheselectionofmeasurementpro(currentprobe,capacitivevoltageprobeand/orartificialnetwormeasurementprocedureused;seeTableC.1ofCISPR32:2015/AMD1:2019.RecommendationsfortheprotectionofspecidefinitionforsmallEUT(seelogarithmofuptothemaximumEQ\*jc3\*hps21\o\al(\s\up5(in),a)EQ\*jc3\*hps21\o\al(\s\up5(ct),a)EQ\*jc3\*hps21\o\al(\s\up5(o),g)EQ\*jc3\*hps21\o\al(\s\up5(r),e)EQ\*jc3\*hps21\o\al(\s\up5(or),lim)EQ\*jc3\*hps21\o\al(\s\up5(w),ts)EQ\*jc3\*hps21\o\al(\s\up5(e),s)EQ\*jc3\*hps21\o\al(\s\up5(n),h)EQ\*jc3\*hps21\o\al(\s\up5(d),al)EQ\*jc3\*hps21\o\al(\s\up5(vi),a)EQ\*jc3\*hps21\o\al(\s\up5(ce),pp)EQ\*jc3\*hps21\o\al(\s\up5(on),to)EQ\*jc3\*hps21\o\al(\s\up5(a),d)EQ\*jc3\*hps21\o\al(\s\up5(i),i)EQ\*jc3\*hps21\o\al(\s\up5(n),s)EQ\*jc3\*hps21\o\al(\s\up5(o),ur)EQ\*jc3\*hps21\o\al(\s\up5(co),an)EQ\*jc3\*hps21\o\al(\s\up5(n),c)EQ\*jc3\*hps21\o\al(\s\up5(tro),es)EQ\*jc3\*hps21\o\al(\s\up5(su),ro)EQ\*jc3\*hps21\o\al(\s\up5(ystem),arcs)EQ\*jc3\*hps21\o\al(\s\up5(s),a)EQ\*jc3\*hps21\o\al(\s\up5(t),n)EQ\*jc3\*hps21\o\al(\s\up5(h),d)EQ\*jc3\*hps21\o\al(\s\up5(tcreat),sparks)EQ\*jc3\*hps21\o\al(\s\up5(e),,w)EQ\*jc3\*hps21\o\al(\s\up5(stat),hile)EQ\*jc3\*hps21\o\al(\s\up5(ic),b)EQ\*jc3\*hps21\o\al(\s\up5(e),o)EQ\*jc3\*hps21\o\al(\s\up5(l),t)EQ\*jc3\*hps21\o\al(\s\up5(e),h)EQ\*jc3\*hps21\o\al(\s\up5(t),t)EQ\*jc3\*hps21\o\al(\s\up5(ric),he)EQ\*jc3\*hps21\o\al(\s\up5(y.),p)EQ\*jc3\*hps21\o\al(\s\up5(O),e)EQ\*jc3\*hps21\o\al(\s\up5(n),a)EQ\*jc3\*hps21\o\al(\s\up5(l),k)EQ\*jc3\*hps21\o\al(\s\up5(th),an)EQ\*jc3\*hps21\o\al(\s\up5(e),d)Limit(10m)=Limit(3m)-20Table10-Requiredhighestfrequencyfimpedanceearthed(IT)industrialpowerdistribgroup2equipmentwitharatedpower>75disturbance.Above30MHz,thelimitsrelectromagneticradiationdistuactivemodeofoperation.Instand-by(oForhigh-frequency(HF)surgicalequipment,frequency(HF)surgicalequipmentshalRecommendationsfortheproTableC.1.Onanopen-areatestsite(OATS)oconjunctionwithmeasurements2,194to3,95一一一一一一一一一一一一一一一一一一一一一一一一一一一CTheaveragelimitsapplytomagnetrondrivTableC.1.WithinharmonicfrequencybanOutsideharmonicfreNOTEInthistable,"harmonicfrequencybanfrequencyranges,inFinalAPDmeasurementsthefrequencyedges1GHzbeomittedatfrequenciesbInanycase,finalAPDmeasTable20-Electromagneticradiationdistur一Table21-Electromagneticradiationdisturbancelimionlyassembledattherequirementsofthisdocument.FortecomponentsorsubassembliesshallberegardedasstasubassembliesforwhichcompliancewiththerelevantNOTE1TheenvironmentsencwhichencompassotherenvironmentsthanthosespeciAtestsiteshallallowemissionsfromtheequipmentundertesttobedistinguishedfromambientReceiverswithquaToavoidthepoCISPR16-1-2:2014/AMD1:2017showsasuchosen(metalplate,metaltube).Theprallowedforincalthemid-bandfrequencyofthedesigturntable'svertica