Agilent3070系統(tǒng)介紹

&軟硬件綜述第1頁(yè)概要Part13070系統(tǒng)介紹Part23070硬件綜述Part33070軟件綜述Part4基本測(cè)試原理第2頁(yè)P(yáng)art13070系統(tǒng)介紹概要在線測(cè)試（ICT）在產(chǎn)線中位置ICT基本測(cè)試原理Agilent3x7y系列測(cè)試界面–夾具安全事項(xiàng)測(cè)試程序開發(fā)流程測(cè)試工具第3頁(yè)在線測(cè)試（ICT）在產(chǎn)線中位置SP505DXSeries5000

SJ50SeriesII

SJ50SeriesIIXL

SJ50SeriesIIValue3070Series3目標(biāo):盡早發(fā)覺(jué)制造缺點(diǎn)－降低PCB板制造成本第4頁(yè)Agilent3070基本測(cè)試原理Agilent3070第5頁(yè)Agilent3070基本測(cè)試原理通常是PCB板安裝完成后第一次電學(xué)測(cè)試經(jīng)過(guò)檢測(cè)PCBA上單個(gè)或多個(gè)元器件來(lái)驗(yàn)證器件值檢驗(yàn)器件安放位置確認(rèn)電路連接查找PCB制造中缺點(diǎn)（短路，開路，錯(cuò)件及零件錯(cuò)位等）第6頁(yè)常見(jiàn)制造缺點(diǎn)焊點(diǎn)短路第7頁(yè)常見(jiàn)制造缺點(diǎn)焊點(diǎn)開路第8頁(yè)常見(jiàn)制造缺點(diǎn)零件安裝錯(cuò)位第9頁(yè)常見(jiàn)制造缺點(diǎn)零件翹起第10頁(yè)在線測(cè)試功效(Summary)模擬器件測(cè)試上電測(cè)試數(shù)字測(cè)試局部功效測(cè)試準(zhǔn)確測(cè)試特殊測(cè)試驗(yàn)證PCB安裝過(guò)程在測(cè)試階段盡快消除顯著PCBA上零件錯(cuò)誤提供最正確測(cè)試方案以取得最大測(cè)試覆蓋率第11頁(yè)Agilent3x7y系列5184nodes2592nodes1296nodes第12頁(yè)Agilent3x7y系列ProcessTesterLowCostTesterHighPerformanceTester3X723X733X75TestCapabilities&StandardProducts:ShortsAnalogICTQuick70Short-wirefixturingPanelTestTestJetTestCapabilities&StandardProducts:ShortsAnalogICTAnalogfunctionalIn-circuitboundaryscanQuick70ShortwirefixturingPanelTestTestJetTestCapabilities&StandardProducts:ShortsAnalogICTanalogfunctionalin-circuitboundaryscanQuick70shortwirefixturingPanelTestTestJetDynamicTestAccessflashprogrammingsolutionPolarityCheck第13頁(yè)Agilent3x7y系列30703x71-unpowerorlimitedpowersystem3x72-ProcessTestSystem3x73-IncircuitTestSystem3x74-FunctionalTestSystem3x75-CombinationTestSystem3x79-TelecommunacationsTestSystem第14頁(yè)測(cè)試界面–夾具第15頁(yè)短線夾具結(jié)構(gòu)第16頁(yè)為何選取短線夾具第17頁(yè)安全事項(xiàng)第18頁(yè)測(cè)試程序開發(fā)流程第19頁(yè)測(cè)試工具第20頁(yè)P(yáng)art23070硬件綜述OutlineAgilent3070結(jié)構(gòu)DUTPowerSupplyTestheadModuleDesignationsCardsinTestheadMotherCardModuleControlCardASRUCardPinCard第21頁(yè)AnatomyofAgilent3070第22頁(yè)AnatomyofAgilent3070(Cont.)第23頁(yè)DUTPowerSuppliesCurrentVoltageOutputNumberAgilent6621AHighLow2Agilent6624AMediumMedium4Agilent6634ALowHigh1Agilent6642AHighHigh1第24頁(yè)Testhead第25頁(yè)ModuleDesignations第26頁(yè)CardsintheTestheadMotherCardModuleControlCardAnalogStimulus-ResponseUnit(ASRU)CardPinCards第27頁(yè)MotherCard提供系統(tǒng)內(nèi)部板卡DC電源SuppliesDCpower分配電信號(hào)到指定ModuleControlCard解析地址Decodesaddress第28頁(yè)MotherCard(Cont.)MultiplexingtheASRUcardtopincardsbymothercard第29頁(yè)ModuleControlCard控制實(shí)際測(cè)試過(guò)程程序自動(dòng)讀取碼(AutofileCode)帶有8個(gè)通用開關(guān)(GPRelay)必須放在每個(gè)module第6槽位四種類型:ControlCardControlPlusCardControlXTCardControlXTP第30頁(yè)ASRUCard提供正確激勵(lì)信號(hào)Appliestheappropriatestimulus使用測(cè)量運(yùn)算放大器進(jìn)行電壓信號(hào)測(cè)量MakesavoltagemeasurementwithMOA(MeasuringOperationalAmplifier)提供直流點(diǎn)信號(hào)和波形發(fā)生器ProvidesDCsourceandawaveformgenerator分配在1號(hào)槽Residesinslot1有A,B,C三個(gè)版本第31頁(yè)P(yáng)inCardHybridDoubleDensityCardHybrid32CardChannelPlusCard(Nolongeravailable,butstillsupported)AccessPlusCardAnalogPlusCardSerialTestPlusCard(STC+)第32頁(yè)HybridDoubleDensityCardTwosides:SideA,SideBMUXratio(MINTpins:D/Rlines):9:216channelsx9pins=144MINTpins第33頁(yè)Hybrid32Card第34頁(yè)P(yáng)art33070軟件綜述概要標(biāo)準(zhǔn)測(cè)試流程軟件綜述BT-Basic及相關(guān)命令3070操作步驟測(cè)試原理第35頁(yè)標(biāo)準(zhǔn)測(cè)試流程UnpoweredtestsShorts&PinstestingAnalogIncircuittestingTestJettestingSetupPowerSuppliesDigitalIncircuittestingAnalogPoweredtestingPoweredtests第36頁(yè)軟件綜述第37頁(yè)BT-Basic界面StatuslineCommandlineOperatingmodeProcessIDnumberWorkingspaceSpecialfunctionkeys第38頁(yè)快捷鍵F1–Edit/CommandF2–RecallPlusF3–RecallMinusF4–ExecuteF5–Mark/SecondMark/ClearMarkF6–TestConsultantF7–PushbuttonQSTATSF8–StoreLineF9–InsertLineF10–DeleteLineF11–ClearLineF12–ClearDisplay第39頁(yè)操作模式第40頁(yè)慣用BT-Basic命令catchangechange“A”to“BA”changemchangem“cd”to“ab”copytocopy<file1>to<directory2>copyovercopy<file1>over<directory2>/<file3>createdirdeleteduplicate第41頁(yè)慣用BT-Basic命令editfind,findnfind“string1”,findn“string2”get,loadmergemerge“file1”;“file2”,5,6;“file3”movemsi,msi$numberscratchsave,re-savesave“file1”第42頁(yè)操作步驟打開系統(tǒng)電源Turnonsystem用設(shè)定用戶名登陸Logonashp3070user打開BT-BasicOpenBT-Basic進(jìn)入到待測(cè)板目錄Gettoboardtestdirectory輸入：testheadpoweron,testheadis1輸入：load“testplan”索緊夾具Fixturelock運(yùn)行程式Run松開夾具Fixtureunlock輸入：testheadpoweroff,testheadis*退出BT-Basic操作exit登出logoff關(guān)機(jī)shutdown第43頁(yè)Testhead操作命令testheadpoweron/offtestheadis1/*fixturelock/unlockfaon/faoffexit第44頁(yè)Testhead‘Config’file第45頁(yè)Testhead‘Config’file(Cont.)Thefilemustbelocatedinthe/..3070/diagnostics/th1/directoryThefilemustbecompiledwiththetestheadoptionThetestheadmaynotbootiftheconfigfileinincorrectThistestheadconfigfileisdefinedduringtheinitialsysteminstallationThetestheadconfigfilemaynotbeusedasaboardlevelconfigfile第46頁(yè)Board‘Config’file第47頁(yè)P(yáng)art4基本測(cè)試原理測(cè)試流程回顧‘testplan’模擬測(cè)試基本原理慣用測(cè)試選項(xiàng)介紹BoardConsultantPushbuttonDebugOtherIssue第48頁(yè)標(biāo)準(zhǔn)測(cè)試流程UnpoweredtestsShorts&PinstestingAnalogIncircuittestingTestJettestingSetupPowerSuppliesDigitalIncircuittestingAnalogPoweredtestingPoweredtests第49頁(yè)AnalogTest–“testplan”第50頁(yè)Analogtest-concept第51頁(yè)Analogtestbasic第52頁(yè)Shortstest第53頁(yè)Shortstest(Cont.)Expectsshorts?Jumpers?Closedswitches?Fuses?Smallvalueresistors?Etc.Unexpectedshorts?Highimpedancenodes?Digitalpins?Resistorsabove10kUnexpectedshorts?Lowimpedancenodes?Powernodes?Resistorsbelow10k第54頁(yè)Shortstest(Cont.)第55頁(yè)P(yáng)instest第56頁(yè)Resistivetest第57頁(yè)CapacitororInductortest第58頁(yè)StatementsyntaxCapacitorcapacitor<value>,<+tol>,<-tol>,<return>,<comp/nocomp>Diodedi